Specimen Preparation for Electron Microscopy
نویسنده
چکیده
In general the SEM sample preparation techniques are more or less similar to the metallographic sample preparation technique for optical microscopy, because both the microscopes reveals the surface topography of sample. In SEM a focussed beam of electrons scans over the specimen surface and the electrons emitted from the sample surface controls the brightness of the CRT spot which also scans the CRT screen with the same raster as the scanning beam.
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